True Sample Topography Acquired by Low-Noise Z Position Sensor
Ahram Kim (Research Product Management of Park Systems, Seoul, Korea)
Piezoelectric material has been widely used as the a...
SrTiO3 Surfaces by Using Park Systems XE-70 AFM
SrTiO3 Surfaces by Using Park Systems XE-70 Atomic Force Microscope
John G. Connell and S. S. Ambrose SeoDepartment of Physics and Astronomy...
Nanoscale Surface Photovoltage
Spectroscopy Investigation of Nanostructures Utilizing the XE-series Instruments
Case Study: Zinc Oxide Nanostructures
BY T.A. Merz, D.R. Doutt, and L.J. Brillso...
Cross-section of Polymer Film
Imaging a Narrow Area Using an XE-100 AFM Instrument
Case study: Cross-section of a Polymer Film
By H.-Y. NieThe University of Western Ontario
Zinc Oxide Surfaces
Nanoscale AFM and KPFM Mapping of Localized Charge and Recombination Centers on Chemically Active ZnO Surfaces
Case Study: Zinc Oxide Surfaces
AlGaN/GaN HEMT Reliability
XE-seriesinstruments create new ways to understand GaN HEMT reliability issues
Case Study: AlGaN/GaN HEMT reliabilityBy Chung-Han Lin, D. R. Doutt, and L. J. Bri...
Optical Property - Photoconductivity
Topography (left image) and photocurrent (right images) with laser source on (top right image) and laser source off (bot...
Patterned Arrays of Magnetic Nanostructure
Patterned arrays of magnetic nanostructures have become one of the key issues in recent years because of its potential application to information techn...
Atomic Force Microscopy and Raman Spectroscopy
1. The basic parameters of the AFM head are defined with the Park Systems software
2. The Labspec softw...
Quantum Dots/Photonic Devices
Optical Properties – SERS/NSOM/Topography
Gold nanoparticles are imaged with high resolution. Gold nanoparticles are known to promo...
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