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  • NX10-AFM
    혁신적인 연구를 위한 최고의 선택 Park NX10
  • SmartScan-AFM
    AFM 사용자를 위해 더 강력하고 더 쉬워진 Park SmartScan
  • NX20-AFM
    최상의 정확성과 재현성의 실현고장 분석 ⁄ 대형시료 연구용 AFMl Park NX20
  • NX-wafer-AFM
    검열부터 계측까지 자동화된 산업용 AFM Park NX-Wafer
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Park XE-Bio Specifications

XY Scanner

Single module flexure XY-scanner with closed-loop control
100 µm × 100 µm

 

Stage

Sample size : up to 50 mm x 50 mm, up to 20 mm thickness
Sample weight : up to 500 g
Manual XY stage travel : 10 mm x 10 mm
Motorized Z stage travel : 14 mm

 

Head

ICM Head : Topography feedback in DC, AC and ARS mode
                       Low-noise ionic current detection
AFM Head : Interference-reduced detection of cantilever deflection
using Super-luminescence diode (830 nm) with low coherency


 

Z Scanner range

Guided high-force flexure scanner
Scan range : 25 µm 
Resonant frequency : > 4.2 kHz 
Petri dish(38mm)

 

Vision

Direct on-axis vision of sample surface and cantilever through IOM
Top-view optics for vision from top (optional)
Focus range : 40mm, manual 
Magnification : 300x

 

Microscope Unit

Dimension: Dimension: 420 mm x 410 mm x 300 mm (W x D x H)
Weight: 17.2 kg

 

Software

NXP

Dedicated system control and data acquisition software
Adjusting feedback parameters in real time
Script-level control through external programs(optional)

NXI

AFM data analysis software

 

Electronics

High performance DSP: 600 MHz with 4800 MIPS
Maximum 16 data images
Maximum data size : 4096 × 4096 pixels
Signal inputs : 20 channels of 16 bit ADC at 500 kHz sampling
Signal outputs : 21 channels of 16 bit DAC at 500 kHz settling
Synchronous signal : End-of-image, end-of-line, and end-of-pixel TTL signals
Active Q control (optional)
Cantilever spring constant calibration (optional)
CE Compliant
Power: 120 W

 

AFM Modes

Standard Imaging

Basic Contact AFM and DFM
Lateral Force Microscopy (LFM)
Phase Imaging
True Non-Contact AFM

Ion Conductance Microscopy (ICM)

DC/AC feed back
Adaptive ARS mode
Approach curve (I-d curve)

Force Measurement

Force Distance (F-D) Spectroscopy
Force Volume Imaging
Spring Constant Calibration by Thermal Method

Optical Properties

Tip-Enhanced Raman Spectroscopy (TERS)
Time-Resolved Photo Current Mapping (Tr-PCM)

 

AFM Accessories

Live Cell Chamber

Environmental control for live cell imaging condition
Temperature, humidity, and pH control

Universal Liquid Cell

Open/closed-cell environment for liquid imaging
Temperature contro

EVENTS

 

Atomic Force Microscopy | AFM Microscope | Park Systems