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  • NX10-AFM
    혁신적인 연구를 위한 최고의 선택 Park NX10
  • SmartScan-AFM
    AFM 사용자를 위해 더 강력하고 더 쉬워진 Park SmartScan
  • NX20-AFM
    최상의 정확성과 재현성의 실현고장 분석 ⁄ 대형시료 연구용 AFMl Park NX20
  • NX-wafer-AFM
    검열부터 계측까지 자동화된 산업용 AFM Park NX-Wafer
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Probe Store - SCM

* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
PPP-EFM 2.8 75 Nanosensors ▪ Cantilever with lower force constant, REQUIRES Ceramic chip carrier
▪ Conductive tip for electric application, Coated with Pt-Ir
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The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.

The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
Platinum 18 14 - ▪ Contact cantilever made of solid platinum
▪ Recommended for high voltage/current application above ±10 V or 1 µA
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The solid platinum probe, whose tip radius is smaller than 20nm, shows better performance than a typical metal-coated probes.

Technical Data Nominal Value Specified Range
Width (µm) 100 90 - 110
Length(µm) 300 250 – 350
Force Constant(N/m) 18 10.8 -25.2
Resonance Frequency (kHz) 14 9.8 – 18.2

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Atomic Force Microscopy | AFM Microscope | Park Systems