| 고객문의 |
  • NX10-AFM
    혁신적인 연구를 위한 최고의 선택 Park NX10
  • SmartScan-AFM
    AFM 사용자를 위해 더 강력하고 더 쉬워진 Park SmartScan
  • NX20-AFM
    최상의 정확성과 재현성의 실현고장 분석 ⁄ 대형시료 연구용 AFMl Park NX20
  • NX-wafer-AFM
    검열부터 계측까지 자동화된 산업용 AFM Park NX-Wafer
our clients
 

A revolutionary all-in-one system for 3D Metrology

Automatic Tip Exchange (ATX)

The ATX automatically locates tips by pattern recognition and uses a novel magnetic approach to disengage a used tip and pick up a new tip, with an incredible 99.9% success rate. The laser spot is then automatically optimized along the X- and Y-axis by motorized positioning knobs.

automatic-tip-exchanger

awh2

Automatic Wafer Handler (EFEM or FOUP)

The NX-3DM can be configured for various automatic wafer handlers, such as EFEM and FOUP. The high-precision, robotic handling arm ensures users get fast and reliable wafer measurements every time.


Ionization System for a more stable scanning

Our innovative ionization system quickly and effectively removes electrostatic charges in thesample’s environment. Since the system always generates and maintains the ideal balance of positive and negative ions, it can create an extremely stably chargedenvironment with negligible contamination from the surrounding area and minimize the risk of accidental electrostatic charge during sample handling.

Ionization-System
 

EVENTS

 

Atomic Force Microscopy | AFM Microscope | Park Systems