| 고객문의 |
  • Park AFM
    Electrical Modes
    For engineers and researchers that need accurate data on conductance, sample resistance,
    and other electrical and topographic properties, Park offers a range of electrical scanning modes.

Dynamic Contact EFM (EFM-DC)

High Resolution and High Sensitivity Imaging of Electrostatic Force

EFM-DC is capable of extremely high definition EFM results. Patented by Park Systems*, EFM-DC actively applies an AC voltage bias to the cantilever and detects the amplitude and the phase change of the cantilever modulation with respect to the applied bias. EFM-DC provides the ability to monitor the second harmonic of the modulation which can be compared to the capacitance of a sample and enhances the electric force signal from the background intermolecular force.

dc-efm-pzt-film

[Topography] / [EFM Amplitude] / [EFM Phase]

Pzt film
Scan size: 2 µm
Using Probe: PPP-EFM
Imaged on a Park XE-Series using EFM-DC Mode.
 

Electrical Modes