| 고객문의 |
  • Park AFM
    Imaging Modes
    Park offers some of the most innovative imaging modes and technology.
    Our True Non-Contact mode is the world’s only truly non-contact AFM scanning mode
    while our standard scanning mode is among the most accurate available.

True Non-Contact™ Mode

Consistently produces high resolution and accurate data while maintaining the integrity of sample.

The True Non-Contact mode preserves tip sharpness and sample surface, and you can get more accurate results. In the True Non-Contact mode, a piezoelectric modulator vibrates a cantilever at small amplitude and a fixed frequency near the resonant frequency of the cantilever. As the tip is brought closer to the sample, the van der Waals attractive force between tip and sample changes the amplitude and the phase of the cantilever’s vibration. These changes are monitored by the patented Z-servo feedback system of the Park AFMs, which maintains a tip-surface distance of just a few nanometers without damaging the sample surface or the tip end.


Nano-arrayed-particles
Nano-arrayed particles
Scan size: 1μm, 250nm, 120nm
Using Probe: AR5T-NCHR
Imaged on a Park NX10 using Non-contact Mode.
 

Imaging Modes