| 고객문의 |
  • Park AFM
    Nanomechanical Modes
    Easily measure the mechanical properties of your sample using our set of mechanical scanning modes.
    Each features Park System’s trademark accuracy so you always know
    you’re collecting data you can rely on.

PinPoint™ Nanomechanical Mode

PinPoint™ Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion force are acquired simultaneously in real-time. While the XY scanner stops, the high speed force-distance curves are taken with well defined control of contact force and contact time between the tip and the sample. Due to controllable data acquisition time, PinPoint™ Nanomechanical mode allows optimized nanomechanical measurement with high signal-to-noise ratio over various sample surfaces.

pinpoint-mechanical
pinpoint-mechanical
 
PS-b-PEO-height

[Height]

PS-b-PEO-adhesion-force

[Adhesion force]

PS-b-PEO-modulus

[Modulus]

PS-b-PEO-stiffness

[Stiffness]

PS-b-PEO (Polystylene-b-polyethylene oxide)
Scan size: 10µm
 

Nanomechanical Modes