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  • Park AFM
    Special Modes

Magnetic Force Microscopy (MFM)

High Resolution and High Sensitivity Imaging of Magnetic Properties

Our MFM mode measures the magnetic variations over a sample surface by detecting the interaction between a magnetized cantilever and sample surface. The cantilever measures surface topography on the first scan, then lifts and follows either the stored surface topography (lift mode, available only in selected countries) or a constant distance (or constant height) at a fixed height above the sample surface.

magnetic-force-microscopy-mfm-f2

The schematics of (a) Force Range technique and (b) two pass technique and (c) corresponding

 
mfm-hdd

(a) Topography (b) MFM Phase

HDD
Scan size: 5µm
Using Probe: PPP-MFMR
Imaged on a Park XE-series using MFM Mode.
 

Special modes